ANSI/IEEE 300-1982

ANSI/IEEE 300-1982 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

ANSI/IEEE 300-1982 Процедуры Стандарт IEEE испытаний для полупроводниковых детекторов заряженных частиц

This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340.